LADE Meeting

Tommaso Rodani

Title: Multi-tip Artifacts in STM Imaging

Abstract

The quality of Scanning Tunneling Microscopy (STM) images is highly dependent on the probe’s shape. A prevalent issue, known as the multi-tip artifact, arises when the probe has an irregular shape, leading to duplicated structures in the image. This talk explores how Neural Networks can be employed to classify such STM images as either artifact-free or affected by multi-tip distortions

Date
Oct 25, 2023 11:30 AM — 12:30 PM
Event
LADE Meeting
Location
Sala Riunioni RIT, Area Science Park
Località Padriciano 99, Trieste, 34149
Area Science Park - RIT
Area Science Park - RIT
Research Institute

The Institute of Research and Innovation Technology (RIT) at Area Science Park carries out cutting-edge research and provides services and consulting to public and private-sector users through its three laboratories equipped with state-of-the-art technology.